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Experimental study and modeling of holographic photonic crystals with defects of the spatial and band-gap structures Научная публикация

Журнал Optoelectronics, Instrumentation and Data Processing
ISSN: 8756-6990 , E-ISSN: 1934-7944
Вых. Данные Год: 2010, Том: 46, Номер: 3, Страницы: 256-263 Страниц : 8 DOI: 10.3103/S8756699010030088
Ключевые слова HOLOGRAPHIC LITHOGRAPHY, PHOTOPOLYMERS, PHOTONIC CRYSTALS, BAND-GAP STRUCTURE, MODELING
Авторы Pen E.F. 1 , Shatalov I.G. 1 , Shelkovnikov V.V. 2
Организации
1 Institute of Automation and Electrometry of the Siberian Branch of the Russian Academy of Sciences, 1, Koptyuga prospect, Novosibirsk, 630090
2 Vorozhtzov Institute of Organic Chemistry, Siberian Branch of the Russian Academy of Science, 9, Academician Lavrentiev Ave., Novosibirsk, 630090

Реферат: Results of experimental studies and modeling of holographic photonic crystals (PCs) with defects of their spatial and band-gap structures and also of studying quasi-crystals are presented. Thicklayer photopolymer materials with a hybrid matrix formed on the basis of the sol-gel technology are used for PC production. A method of obtaining delocalized defects is proposed and implemented. A code is written for computer modeling of the spatial PC structure, which offers a clear idea about the appearance of the synthesized crystal and the expected spectral characteristics.
Библиографическая ссылка: Pen E.F. , Shatalov I.G. , Shelkovnikov V.V.
Experimental study and modeling of holographic photonic crystals with defects of the spatial and band-gap structures
Optoelectronics, Instrumentation and Data Processing. 2010. V.46. N3. P.256-263. DOI: 10.3103/S8756699010030088 WOS РИНЦ
Оригинальная версия: Пен Е.Ф. , Шаталов И.Г. , Шелковников В.В.
ЭКСПЕРИМЕНТАЛЬНЫЕ ИССЛЕДОВАНИЯ И МОДЕЛИРОВАНИЕ ГОЛОГРАФИЧЕСКИХ ФОТОННЫХ КРИСТАЛЛОВ С ДЕФЕКТАМИ ПРОСТРАНСТВЕННОЙ И ЗОННОЙ СТРУКТУР
Автометрия. 2010. Т.46. №3. С.64-73. РИНЦ
Даты:
Опубликована в печати: 1 июн. 2010 г.
Опубликована online: 31 июл. 2010 г.
Идентификаторы:
Web of science WOS:000420881500008
РИНЦ 41188275
OpenAlex W2084064860
Альметрики: