Dispersion of real and imaginary parts of cubic susceptibility of submicon films of pseudoisocyanine j aggregates

Dispersion of real and imaginary parts of cubic susceptibility of submicon films of pseudoisocyanine j aggregates Научная публикация

Конференция

11th International Vavilov Conference on Nonlinear Optics 1997
24-28 июн. 1997 , Novosibirsk

Журнал

Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X , E-ISSN: 1996-756X

Вых. Данные

Год: 1998, Том: 3485, Страницы: 418-424 Страниц : 7 DOI: 10.1117/12.328262

Ключевые слова

Cubic susceptibility; J aggregates; Thin films

Авторы

Plekhanov A.I. ¹ , Rautian S.G. ¹ , Safonov V.P. ¹ , Chubakov P.A. ¹ , Orlova N.A. ² , Shelkovnikovb V.V. ²

Организации

1	(Scopus) Institute of Automation and Electrometry, 1 Academician Koptyug Ave., Novosibirsk, 630090, Russian Federation
2	(Scopus) Novosibirsk Institute of Organic Chemistry, 9 Academician Lavrentjev Ave., Novosibirsk, 630090, Russian Federation

The dispersion of cubic optical susceptibility of submicron films of pseudoisocianine J aggregates are measured by a z-scan technique. The values of Imx(3) , Rex(3) near to J-peak were ~ 10~5 esu. The measurements have shown that the films near to J-peak have negative sign of Imx((3)(ω) , which corresponds to nonlinear bleaching of absorption. The maximum | Imx(3) , (ω) is observed for ω ≃ ω j. It is found that at lowfrequency side of J-peak the sign of Imx(3)(<∗>) changes on positive. The measured dependence Rex(3) (ω) 'Ias compared with the value calculated by Kramers-Kronig transformation. For optical dense samples the contribution of a thermal nonlinearity is displayed. The spectral behavior features of Rex(3) (ω) an<∗ Imx(3) (ω) Rex(3) explained by four-level model of Frenkel exciton. © 1998 SPIE. All rights reserved.

Plekhanov A.I. , Rautian S.G. , Safonov V.P. , Chubakov P.A. , Orlova N.A. , Shelkovnikovb V.V.
Dispersion of real and imaginary parts of cubic susceptibility of submicon films of pseudoisocyanine j aggregates
Proceedings of SPIE - The International Society for Optical Engineering. 1998. V.3485. P.418-424. DOI: 10.1117/12.328262 WOS Scopus РИНЦ OpenAlex

Опубликована в печати:

21 окт. 1998 г.

Web of science:	WOS:000077140200048
Scopus:	2-s2.0-85076819217
РИНЦ:	43219122
OpenAlex:	W2076155556

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