Dispersion of real and imaginary parts of cubic susceptibility of submicon films of pseudoisocyanine j aggregates

Dispersion of real and imaginary parts of cubic susceptibility of submicon films of pseudoisocyanine j aggregates Full article

Conference

11th International Vavilov Conference on Nonlinear Optics 1997
24-28 Jun 1997 , Novosibirsk

Journal

Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X , E-ISSN: 1996-756X

Output data

Year: 1998, Volume: 3485, Pages: 418-424 Pages count : 7 DOI: 10.1117/12.328262

Tags

Cubic susceptibility; J aggregates; Thin films

Authors

Plekhanov A.I. ¹ , Rautian S.G. ¹ , Safonov V.P. ¹ , Chubakov P.A. ¹ , Orlova N.A. ² , Shelkovnikovb V.V. ²

Affiliations

1	(Scopus) Institute of Automation and Electrometry, 1 Academician Koptyug Ave., Novosibirsk, 630090, Russian Federation
2	(Scopus) Novosibirsk Institute of Organic Chemistry, 9 Academician Lavrentjev Ave., Novosibirsk, 630090, Russian Federation

The dispersion of cubic optical susceptibility of submicron films of pseudoisocianine J aggregates are measured by a z-scan technique. The values of Imx(3) , Rex(3) near to J-peak were ~ 10~5 esu. The measurements have shown that the films near to J-peak have negative sign of Imx((3)(ω) , which corresponds to nonlinear bleaching of absorption. The maximum | Imx(3) , (ω) is observed for ω ≃ ω j. It is found that at lowfrequency side of J-peak the sign of Imx(3)(<∗>) changes on positive. The measured dependence Rex(3) (ω) 'Ias compared with the value calculated by Kramers-Kronig transformation. For optical dense samples the contribution of a thermal nonlinearity is displayed. The spectral behavior features of Rex(3) (ω) an<∗ Imx(3) (ω) Rex(3) explained by four-level model of Frenkel exciton. © 1998 SPIE. All rights reserved.

Plekhanov A.I. , Rautian S.G. , Safonov V.P. , Chubakov P.A. , Orlova N.A. , Shelkovnikovb V.V.
Dispersion of real and imaginary parts of cubic susceptibility of submicon films of pseudoisocyanine j aggregates
Proceedings of SPIE - The International Society for Optical Engineering. 1998. V.3485. P.418-424. DOI: 10.1117/12.328262 WOS Scopus РИНЦ OpenAlex

Published print:

Oct 21, 1998

Web of science:	WOS:000077140200048
Scopus:	2-s2.0-85076819217
Elibrary:	43219122
OpenAlex:	W2076155556

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